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An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 other wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means μA and B. Consider the model log μ = a + Bx, where x = 1 for treatment B and x = 0 for treatment A. a. Show that ß = log Blog μA = log(B/A) and eß = μb/MA. the addel. Report the prediction eation and interpret 8. SO et H: A B by conducting the Wald or likelihood-ratio test of Ho: B = 0. Interpret. d. Construct a 95% confidence interval for B/A. [Hint: Construct one for B = log(μB/μA) and then exponentiate.]

An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 other wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means μA and B. Consider the model log μ = a + Bx, where x = 1 for treatment B and x = 0 for treatment A. a. Show that ß = log Blog μA = log(B/A) and eß = μb/MA. the addel. Report the prediction eation and interpret 8. SO et H: A B by conducting the Wald or likelihood-ratio test of Ho: B = 0. Interpret. d. Construct a 95% confidence interval for B/A. [Hint: Construct one for B = log(μB/μA) and then exponentiate.]

Glencoe Algebra 1, Student Edition, 9780079039897, 0079039898, 2018
Glencoe Algebra 1, Student Edition, 9780079039897, 0079039898, 2018
18th Edition
ISBN:9780079039897
Author:Carter
Publisher:Carter
Chapter10: Statistics
Section10.3: Measures Of Spread
Problem 1GP
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An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 other wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means μA and µg. Consider the model log μ = a + Bx, where x = 1 for treatment B and x = 0 for treatment A. a. Show that B = logμB - log μA = log(μB/A) and eß = μb/MA. Firthe addel. Report the prediction eation and interpret 8. Sol UAB by onducting the Wald or likelihood-ratio test of Ho: B = 0. Interpret. d. Construct a 95% confidence interval for B/A. [Hint: Construct one for B = log(μB/μA) and then exponentiate.]
Transcribed Image Text:An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 other wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means μA and µg. Consider the model log μ = a + Bx, where x = 1 for treatment B and x = 0 for treatment A. a. Show that B = logμB - log μA = log(μB/A) and eß = μb/MA. Firthe addel. Report the prediction eation and interpret 8. Sol UAB by onducting the Wald or likelihood-ratio test of Ho: B = 0. Interpret. d. Construct a 95% confidence interval for B/A. [Hint: Construct one for B = log(μB/μA) and then exponentiate.]
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