You are working in a laboratory that makes frequent use of a scanning tunneling microscope (STM) to study surfaces of materials. The current through the tip of an STM (see figure) is very sensitive to differences in the width of the gap between the tip and the sample surface. Assume the transmission coefficient for the electron falls off exponentially in this direction with a decay length of 0.100 nm, that is, with C = 10.0 nm 1 in Te-2CL, Your supervisor asks you to determine the ratio of the current when the STM tip is 0.498 nm above a surface feature (I₁) to the current when the tip is 0.526 nm above the surface (I2). 12

Principles of Instrumental Analysis
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ISBN:9781305577213
Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
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Chapter12: Atomic X-ray Spectrometry
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You are working in a laboratory that makes frequent use of a scanning tunneling microscope (STM) to study surfaces of materials. The current through the tip of an STM (see figure) is very sensitive to
differences in the width of the gap between the tip and the sample surface. Assume the transmission coefficient for the electron falls off exponentially in this direction with a decay length of 0.100 nm, that
is, with C = 10.0 nm¯¹ in T = e−2CL. Your supervisor asks you to determine the ratio of the current when the STM tip is 0.498 nm above a surface feature (I) to the current when the tip is 0.526 nm above
the surface (I2).
+
(i)
Transcribed Image Text:You are working in a laboratory that makes frequent use of a scanning tunneling microscope (STM) to study surfaces of materials. The current through the tip of an STM (see figure) is very sensitive to differences in the width of the gap between the tip and the sample surface. Assume the transmission coefficient for the electron falls off exponentially in this direction with a decay length of 0.100 nm, that is, with C = 10.0 nm¯¹ in T = e−2CL. Your supervisor asks you to determine the ratio of the current when the STM tip is 0.498 nm above a surface feature (I) to the current when the tip is 0.526 nm above the surface (I2). + (i)
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