The optimum level of inspection occurs when we catch at least 98.6 percent of the defectsO a. TRUEO b. FALSEJS PAGEFINISCoaacerF2F3F4F5F6F7F8F9F10F11z'图,#&4.O 67%24%23近

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Practical Management Science

6th Edition

ISBN:9781337406659

Author:WINSTON, Wayne L.

Publisher:WINSTON, Wayne L.

Chapter2: Introduction To Spreadsheet Modeling

Section: Chapter Questions

Problem 20P: Julie James is opening a lemonade stand. She believes the fixed cost per week of running the stand...

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/mod/quiz/attemptphp?attempt=D1600647&cmid=815158&page=9 n (Academic) ns Management Fall20 The X-bar chart reports whether if there has been a change in the number of defective items in a sample Select one: O a. True O b. False Time left 1:2 a 0) E ch F8 F9 F10 F11 F12 F3 F4 F5 F6 F7 48 5 0 7 9 E R F HI J- K L 而

c) A process manufactures ball bearing whose diameters are normally distributed with mean 2.505cm and standard deviation 0.008cm.Specifications call for the diameter to be in the interval 2.5 ‡ 0.01 cm. estimate the proportion of the ball bearings will meet the specification?
Ettlie Engineering has a new catalyst injection system for your countertop production line. Your process engineering departmenthas conducted experiments and determined that the mean is 8.01 grams with a standard deviation of .03. Your specificationsare: m = 8.0 and s = .04, which means an upper specification limit of 8.12 [ = 8.0 + 3(.04)] and a lower specification limit of7.88 [= 8.0 - 3(.04)].What is the Cpk performance of the injection system?
DEFINE: Typical descriptive research measuring tools 1. Descriptive statistics 2. Frequency table (with frequency and percent) 3. Charts (pie chart, bar chart, histogram, etc.) 4. Mean interpretation table (with the scale, its range for measurement purposes, scale description, and the mean interpretation) Typical correlational and comparative research measuring tools 1. Correlations 2. t-Test (paired samples, independent samples t-test) – for independent samples t-test, the grouping variable should be two categories only. 3. Analysis of variance (ANOVA) 4. Scales reliability test (interval or ratio scaled data) 5. Factor analysis 6. Normality test 7. Multiple regression analysis
Pareto analysis is used to show how common product defects can be related to each other. A) true b) fales
What is the sample t-statistic and the critical t-value? Count Design A Design B Di = Xi - X'i 1 135.20 108.40 26.80 2 203.10 190.30 12.80 3 208.20 170.20 38.00 4 141.70 109.10 32.60 5 244.30 217.80 26.50 6 164.10 172.70 -8.60 7 266.90 224.40 42.50 8 130.20 112.00 18.20 9 138.90 92.30 46.60 10 171.20 131.60 39.60 Sample mean= 180.38 152.88 27.50 Sample standard deviation= 48.29 48.43 16.60
We want to determine the AOQ for an acceptance samplingplan when the quality of the incoming lots in percent defectiveis 1.5%, and then again when the incoming percent defective is 5%.T he sample size is 80 units for a lot size of 550 units. Furthermore,Pa at 1.5% defective levels is 0.95. At 5% incoming defective levels,the Pa is found to be 0.5. Determine the average outgoing qualityfor both incoming percent defective levels.
Rolls of coiled wire are monitored using a c-chart. Twenty rolls have been examined, and the number of defects per roll has been recorded in the following table. Using the set of 20 observations, perform run tests on the data. What can you conclude about the data? Sample Number of Defects Sample Number of Defects 11 1 2 3 4 5 167390 Test First Second 297445TASA 6 8 12 13 14 15 16. 17 18 19 20 Conclusion 6 7 5 7 5 106
Please do not give solution in image format thanku A normally distributed process uses 66.7% of the specification band. It is centered at the nominal dimension, located halfway between the upper and lower specification limits. a) Estimate ?? and ???. Interpret these ratios. b) What fallout level (fraction defective) is produced?
How does Taguchi's approach to measuring variation support the Deming philosophy?
A process that produces computer chips has a mean of .04 defective chip and a standard deviationof .003 chip. The allowable variation is from .03 to .05 defective.a. Compute the capability index for the process.b. Is the process capable?
6. The defect rate for your product has historically been about 4.50%. For a sample size of 500, the upper and lower 3-sigma control chart limits are: Part 2 UCLp = _______ (enter your response as a number between 0 and 1, rounded to four decimal places). The Standard deviation of defect rate of product is given __________. The Upper and Lower 3-sigma control charts limits are: UCLp ________ LCLp ________

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The optimum level of inspection occurs when we catch at least 98.6 percent of the defect O a. TRUE O b. FALSE